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IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

titleISBN-13
(ISBN-10)		year of publication
Defect and Fault Tolerance in Vlsi Systems , 17th IEEE International Symposium978-O-7695-1832-9
(O-7695-1832-X)		2002

I.I.S. · I.S.O. · International Symposium · S.O.

IEEE International Symposium on Electromagnetic Compatibility