title | media type | ISBN-13 | year of publica- tion | other author(s) |
---|---|---|---|---|
1995 Japan Iemt Symposium: Proceedings of 1995 Japan International Electronic Manufacturing Technology Symposium: December 4-6, 1995 Omiya, Japan | Paperback | 978-0-7803-3622-3 | 1996 | |
Eleventh Annual IEEE Semiconductor Thermal Measurement and Management Symposium | " | 978-0-7803-2434-3 | 1995 | |
IEEE 50th Electronic Components and Technology Conference 2000 | " | 978-0-7803-5908-6 | 2001 | |
IEEE 50th Electronic Components and Technology Conference 2000 | Hardcover | 978-0-7803-5909-3 | 2000 | |
IEEE 50th Electronic Components and Technology Conference 2000 | " | 978-0-7803-5911-6 | 2000 | |
Sixteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium | Paperback | 978-0-7803-5916-1 | 2000 | |
Sixteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium | Hardcover | 978-0-7803-5917-8 | 2000 | IEEE |
Thirteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium: Proceedings 1997 Austin, Tx, Usa, January 28-30, 1997 | Paperback | 978-0-7803-3793-0 | 1997 | " |
C.A. · C.P. · C.P.A. · I.A. · I.C. · I. P. · IEEE Components · P. A.