| Titel | Art | ISBN-13 (ISBN-10) | Erscheinungsjahr |
|---|---|---|---|
| Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces | Taschenbuch | 978-3-642-06663-4 (3-642-06663-1) | 2010 |
| Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces | Gebunden | 978-3-540-28405-5 (3-540-28405-2) | 2006 |