Fred A. Stevie

Springer · Wiley

titleISBN-13
(ISBN-10)
year of publica-
tion
other author(s)
Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice978-0-387-23116-7
(0-387-23116-1)
2004Lucille A. Giannuzzi
Secondary Ion Mass Spectrometry: A Practical Handbook for Depth Profiling and Bulk Impurity Analysis978-0-471-51945-4
(0-471-51945-6)
1989Robert G. Wilson · Charles W. Magee

A.S. · F A · F. A. Stevie · F・S · Fred A.

 

Fred A. Stindt