title | media type | ISBN-13 | year of publica- tion | other author(s) | |
---|---|---|---|---|---|
Electronic Material Science and Surfaces, Interfaces, and Thin Films for Microelectronics | Hardcover | 978-0-470-22478-6 | 2008 | ||
Electronic Materials Science | " | 978-0-471-69597-4 | 2005 | ||
Handbook of Ellipsometry | " | 978-0-8155-1499-2 | 2005 | Harland Tompkins | |
Handbook of Ellipsometry | Gebunden | 978-3-540-22293-4 | 2005 | Harland G. Tompkins | |
In Situ Process Diagnostics and Modeling: Volume 569 | Hardcover | 978-1-55899-476-8 | 1999 | Orlando Auciello · Alan R. Krauss · J. Albert Schultz | |
Surfaces, Interfaces, and Films for Microelectronics | " | 978-0-470-17447-0 | 2008 |
Cambridge University Press · Springer · Wiley · William Andrew