Eishi H. Ibe

E.H. · H. I.

Springer · Wiley

titleISBN-13
(ISBN-10)
year of publica-
tion
other author(s)
Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances978-1-4419-6714-5
(1-4419-6714-1)
2010Nobuyasu Kanekawa · Takashi Suga · Yutaka Uematsu
Terrestrial Radiation Effects in ULSI Devices and Electronic Systems978-1-118-47929-2
(1-118-47929-7)
2015

 

Eismann Hans-Georg