| Titel | Art | ISBN-13 | Erschei- nungsjahr | andere Autoren | |
|---|---|---|---|---|---|
| CMOS Past, Present and Future | Paperback | 978-0-08-102139-2 | 2018 | Henry Radamson · Jun Luo · Chao Zhao | |
| Extended Defects in Germanium: Fundamental and Technological Aspects | Taschenbuch | 978-3-642-09921-2 | 2010 | Cor Claeys | |
| Extended Defects in Germanium: Fundamental and Technological Aspects | Gebunden | 978-3-540-85611-5 | 2009 | " | |
| Germanium-Based Technologies: From Materials to Devices | Hardcover | 978-0-08-044953-1 | 2007 | " | |
| Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact | Gebunden | 978-3-319-93924-7 | 2018 | " | |
| Radiation Effects in Advanced Semiconductor Materials and Devices | " | 978-3-540-43393-4 | 2002 | C. Claeys | |
| Random Telegraph Signals in Semiconductor Devices | Hardcover | 978-0-7503-1273-8 | 2016 | Cor Claeys |
CRC Press · Pergamon Press · Springer