| Titel | ISBN-13 (ISBN-10) | Erscheinungsjahr |
|---|---|---|
| High speed and Highly Accurate Tip-Scanning Atomic Force Microscope: Design Methodology, Control Strategy, and Performance Evaluation for the ... Microscope for the Industrial Large Samples | 978-3-639-OO27O-6 (3-639-OO27O-9) | 2013 |