Institution of Engineering and Technology · Springer
| title | media type | ISBN-13 | year of publica- tion | other author(s) | |
|---|---|---|---|---|---|
| Advances in Electronic Testing: Challenges and Methodologies | Paperback | 978-1-4899-8773-0 | 2014 | ||
| Advances in Electronic Testing: Challenges and Methodologies | Hardcover | 978-0-387-29408-7 | 2006 | ||
| Cross-Layer Reliability of Computing Systems | " | 978-1-78561-797-3 | 2020 | Giorgio Di Natale · Stefano Di Carlo · Alberto Bosio · Ramon Canal | |
| Dependable Multicore Architectures at Nanoscale | Taschenbuch | 978-3-319-85391-8 | 2019 | Marco Ottavi · Salvatore Pontarelli | |
| Dependable Multicore Architectures at Nanoscale | Gebunden | 978-3-319-54421-2 | 2017 | Marco Ottavi · Salvatore Pontarelli | |
| Embedded Processor-Based Self-Test | Paperback | 978-1-4419-5252-3 | 2011 | A. Paschalis · Yervant Zorian | |
| Embedded Processor-Based Self-Test | Hardcover | 978-1-4020-2785-7 | 2004 | A. Paschalis · Yervant Zorian | |