| title | media type | ISBN-13 | year of publica- tion | other author(s) |
|---|---|---|---|---|
| Defects in Microelectronic Materials and Devices | Paperback | 978-0-367-38639-9 | 2019 | Ronald D. Schrimpf |
| Defects in Microelectronic Materials and Devices | Hardcover | 978-1-4200-4376-1 | 2008 | " |
| Noise in Devices And Circuits 3 | Paperback | 978-0-8194-5839-1 | 2005 | Alexander A. Balandin · Francois Danneville · M. Jamal Deen |
| Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices | Hardcover | 978-981-238-940-4 | 2004 | |
D.F. · D. M. · D. M. Fleetwood · Daniel Fleetwood · Daniel M. · M. F.
CRC Press · Routledge · Society of Photo Optical · World Scientific Pub Co Inc