| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| Microscopy of materials: Modern imaging methods using electron, X-ray, and ion beams | 978-0-470-09217-0 (0-470-09217-3) | 1975 | |
| X-Ray Metrology in Semiconductor Manufacturing | 978-0-8493-3928-8 (0-8493-3928-6) | 2006 | Brian K. Tanner |
D B · D. Bowen · D.K · D.K. Bowen · K. B. · Keith Bowen