| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits: Ipfa 2001 | 978-O-78O3-6675-6 (O-78O3-6675-1) | 2001 | International Symposium on the Physical & Failure Analysis of integrat · Wilson Tan · IEEE Reliability |
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