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Cor Claeys

C C · C. Claeys

TitelArt ISBN-13Erschei-
nungsjahr		andere Autoren
Cyrstalline Defects and Contamination: Their Impact and Control in Device Manufacturing IV - DECON 2005Hardcover
978-1-56677-428-42005Bernd O. Kolbesen · Lazlo Fabry · Francois Tardif
Extended Defects in Germanium: Fundamental and Technological AspectsTaschenbuch 978-3-642-09921-22010
Extended Defects in Germanium: Fundamental and Technological AspectsGebunden 978-3-540-85611-52009Eddy Simoen
Germanium-Based Technologies: From Materials to DevicesHardcover
978-0-08-044953-12007  "
Low Temperature Electronics: Physics, Devices, Circuits, and Applications  "
978-0-12-310675-92000Edmundo A. Gutierrez-D · Jamal Deen
Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device ImpactTaschenbuch 978-3-030-06747-22019
Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device ImpactGebunden 978-3-319-93924-72018Eddy Simoen
Radiation Effects in Advanced Semiconductor Materials and Devices  " 978-3-540-43393-42007  "
Random Telegraph Signals in Semiconductor DevicesHardcover
978-0-7503-1273-82016  "

Academic Press · CRC Press · Electrochemical Society · Pergamon Press · Springer

 

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