Springer · World Scientific Publishing Company
| title | media type | ISBN-13 | year of publica- tion | other author(s) |
|---|---|---|---|---|
| Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections | Paperback | 978-1-4471-2641-6 | 2013 | |
| Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections | Hardcover | 978-0-85729-309-1 | 2011 | Zhenghao Gan · Wei Li |
| Electromigration In Ulsi Interconnections | Paperback | 978-981-4273-32-9 | 2010 | |
| Electromigration Modeling at Circuit Layout Level | " | 978-981-4451-20-8 | 2013 | |
| Theory and Practice of Quality and Reliability Engineering in Asia Industry | " | 978-981-10-9834-5 | 2018 | Thong Ngee Goh |
| Theory and Practice of Quality and Reliability Engineering in Asia Industry | Hardcover | 978-981-10-3288-2 | 2017 | " |
C.M. · C. T. · C Tan · M. T. · M. TAN · Ming Tan