| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| System-on-Chip Test Architectures, Volume .: Nanometer Design for Testability | 978-O-12-373973-5 (O-12-373973-X) | 2007 | Laung-Terng Wang · Nur A. Touba |
C.S. · C. Stroud · Charles E. · Charles S.