| Titel | Art | ISBN-13 (ISBN-10) | Erschei- nungsjahr | andere Autoren |
|---|---|---|---|---|
| Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs | Taschenbuch | 978-3-319-34534-5 (3-319-34534-6) | 2016 | |
| Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs | Gebunden | 978-3-319-02377-9 (3-319-02377-2) | 2013 | Krishnendu Chakrabarty |