| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| High Resolution X-ray Diffractometry and Topography | 978-0-85066-758-5 (0-85066-758-5) | 1998 | D.K. Bowen |
| X-ray Diffraction Topography | 978-0-08-019692-3 (0-08-019692-6) | 1976 | |
| X-ray Metrology in Semiconductor Manufacturing | 978-0-8493-3928-8 (0-8493-3928-6) | 2006 | D. Keith Bowen · David K. Bowen · Brian K. Tanner |
CRC Press · Pergamon Press · Taylor & Francis Ltd