| Titel | Art | ISBN-13 (ISBN-10) | Erscheinungsjahr |
|---|---|---|---|
| Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State | Taschenbuch | 978-3-662-14618-7 (3-662-14618-5) | 2013 |
| Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State | Gebunden | 978-3-540-00414-1 (3-540-00414-9) | 2003 |