A. Benninghoven

A. B. · Alfred Benninghoven

Elsevier Science · Springer

TitelArt ISBN-13Erschei-
nungsjahr
andere Autoren
Ion Formation from Organic Solids: Proceedings of the Second International Conference Münster, Fed. Rep. of Germany September 7-9, 1982Gebunden
978-3-540-12244-91983
Ion Formation from Organic Solids: Proceedings Of The Second International Conference Münster, Fed. Rep. Of Germany September 7-9, 1982Taschenbuch
978-3-642-87150-41983
Secondary Ion Mass SpectrometryHardcover 978-99954-39-84-21984
Secondary Ion Mass Spectrometry Sims III  "
978-0-387-11372-21982
Secondary Ion Mass Spectrometry SIMS III: Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August ... Series in Chemical Physics , Band 19)Gebunden
978-3-540-11372-01982J. Giber · J. Laszlo · M. Riedel · H.W. Werner
Secondary Ion Mass Spectrometry Sims Iii: Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August ... Series in Chemical Physics , Band 19)Taschenbuch
978-3-642-88154-11982
Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry Stanford ...  "
978-3-642-61873-41979
Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry Stanford ... Series in Chemical Physics , Band 9)Gebunden
978-3-540-09843-01980C.A. Jr. Evans · R.A. Powell · R. Shimizu · H.A. Storms
Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry Stanford ... Stanford, California, USA August 27-31, 1979Paperback
978-3-642-61872-72011C.A. Jr. Evans · R.A. Powell
Secondary Ion Mass Spectrometry Sims IV: Proceedings of the Fourth International Conference, Osaka, JapanTextbook Binding
978-0-387-13316-41984J. Okano · R. Shimizu · H. W. Werner
Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983Taschenbuch
978-3-642-82258-22012J. Okano · R. Shimizu · H.W. Werner
Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983Gebunden
978-3-540-13316-21984J. Okano · R. Shimizu · H.W. Werner
Sims XIIHardcover
978-0-444-50323-72000P. Bertrand · H.-N. Migeon · Helmut W. Werner

 

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