VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers (Communications in Computer and Information Science)

International

by: Anirban Sengupta · Sudeb Dasgupta · Virendra Singh · Rohit Sharma · Santosh Kumar Vishvakarma

Paperback

ISBN: 978-981-329-766-1

ISBN-10: 981-329-766-2

Springer · 2019