Migration Imaging of the Transient Electromagnetic Method

Changchun

by: Xiu Li · Guoqiang Xue · Changchun Yin

Hardcover

ISBN: 978-981-10-2707-9

ISBN-10: 981-10-2707-2

Springer · 2016

See also:
2018PaperbackMigration Imaging of the Transient Electromagnetic Method