Photo-Excited Charge Collection Spectroscopy: Probing the traps in field-effect transistors (SpringerBriefs in Physics)

by Seongil Im Paperback details (USA). (see also: eBook (Kindle)) details (UK). (see also: eBook (Kindle)) details (Germany). (see also: Kindle Ausgabe) ISBN: 978-94-007-6391-3 ISBN-10: 94-007-6391-3 Springer · 2013