year of publication | ISBN | author(s) | title |
1996 | 978-1-62841-004-4 | Jorge Ojeda-Castaneda · Carlos Gomez-Reino | Selected Papers on Zone Plates (SPIE Milestone Series Vol. MS128SC) |
| 978-1-62841-014-3 | Radar Sensor Technology XVIII (Proceedings of SPIE) |
| 978-1-62841-023-5 | Display Technologies and Applications for Defense, Security, and Avionics VIII; and Head- and Helmet-Mounted Displays XIX (Proceedings of SPIE) |
| 978-1-62841-027-3 | Automatic Target Recognition XXIV (Proceedings of SPIE) |
| 978-1-62841-030-3 | Algorithms for Synthetic Aperture Radar Imagery XXI (Proceedings of SPIE) |
2014 | 978-1-62841-035-8 | Fiber Optic Sensors and Applications XI (Proceedings of SPIE) |
| 978-1-62841-043-3 | Advanced Environmental, Chemical, and Biological Sensing Technologies XI (Proceedings of SPIE) |
| 978-1-62841-062-4 | Defense and Security: Ir Sensors and Systems; Laser Sensors and Systems; and Next Generation Sensors and Systems (Symposium CD) |
| 978-1-62841-081-5 | Silicon Photonics and Photonic Integrated Circuits IV (Proceedings of SPIE) |
2015 | 978-1-62841-180-5 | David Krohn · Trevor MacDougall · Alexis Mendez | Fiber Optic Sensors: Fundamentals and Applications |
2014 | 978-1-62841-183-6 | Bernard C. Kress | Field Guide to Digital Micro-optics |
'' | 978-1-62841-318-2 | Matias R. Viotti · Armando Albertazzi Gonçalves | Robust Speckle Metrology Techniques for Stress Analysis and NDT (SPIE Press Monograph PM251) |
'' | 978-1-62841-334-2 | Eric Udd · William B. Spillman | Field Guide to Fiber Optic Sensors |
2015 | 978-1-62841-340-3 | Semiconductor Lasers and Applications VI (Proceedings of SPIE) |
'' | 978-1-62841-372-4 | Wilfried Neumann | Applications of Dispersive Optical Spectroscopy Systems |
| 978-1-62841-472-1 | Novel In-Plane Semiconductor Lasers XIV (Proceedings of SPIE) |
| 978-1-62841-473-8 | Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XIX (Proceedings of SPIE) |
| 978-1-62841-485-1 | Color Imaging XX: Displaying, Processing, Hardcopy, and Applications (Proceedings of SPIE) |
2015 | 978-1-62841-516-2 | Valery Tuchin | Tissue Optics, Light Scattering Methods and Instruments for Medical Diagnosis |
'' | 978-1-62841-547-6 | J. Scott Tyo · Andrey Alenin | Field Guide to Linear Systems in Optics |
| 978-1-62841-577-3 | Radar Sensor Technology XIX; Active and Passive Signatures VI (Proceedings of SPIE) |
| 978-1-62841-581-0 | Laser Radar Technology and Applications XX; and Atmospheric Propagation XII (Proceedings of SPIE) |
2015 | 978-1-62841-586-5 | Daniel D. Desjardins | Display Technologies and Applications for Defense, Security, and Avionics IX; Head- and Helmet-Mounted Displays XX (Proceedings of SPIE) |
| 978-1-62841-591-9 | Algorithms for Synthetic Aperture Radar Imagery XXII (Proceedings of SPIE) |
| 978-1-62841-596-4 | Fiber Optic Sensors and Applications XII (Proceedings of SPIE) |
2015 | 978-1-62841-624-4 | Joseph Haus · Alexei Zheltikov | Nonlinear Optics and Applications IX (Proceedings of SPIE) |
2016 | 978-1-62841-680-0 | Byoungho Lee · Soon-gi Park · Keehoon Hong | Design and Implementation of Autostereoscopic Displays (Tutorial Texts) |
| 978-1-62841-735-7 | Printed Memory and Circuits (Proceedings of SPIE) |
2015 | 978-1-62841-811-8 | Bo Su · Eric Solecky · Alok Vaid | Introduction to Metrology Applications in IC Manufacturing (Tutorial Texts) |
2015 | 978-1-62841-821-7 | Riedl · Max J. | Optics for Technicians (SPIE press monograph vol. PM258) |
'' | 978-1-62841-825-5 | Jiang Hsieh | Computed Tomography: Principles, Design, Artifacts, and Recent Advances |
2016 | 978-1-62841-840-8 | John C. Stover | Optical Scattering: Measurement and Analysis |
2015 | 978-1-62841-901-6 | Lin Li · Kevin P. Thomspon · Ligong Zheng | AOPC 2015: Optical Design and Manufacturing Technologies (Proceedings of SPIE) |
'' | 978-1-62841-904-7 | Yanbiao Liao · Weixu Zhang · Desheng Jiang · Wei Wang · Gilberto Brambilla | AOPC 2015 (Proceedings of SPIE) |
2016 | 978-1-62841-905-4 | Lars W. Liebmann · Kaushik Vaidyanathan · Lawrence Pileggi | Design Technology Co-optimization in the Era of Sub-resolution Ic Scaling (Tutorial Texts) |