Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

by: Ruijing Shen · Sheldon X.-D. Tan · Hao Yu

Paperback

details (United States).
(see also: eBook (Kindle))

details (Canada).
(see also: eBook (Kindle))

ISBN: 978-1-4614-0789-8

ISBN-10: 1-4614-0789-3

Springer · 2012