Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach (Microsystems)

Compatibility

by: Tomi Laurila · Vesa Vuorinen · Mervi Paulasto-Kröckel

Paperback

ISBN: 978-1-4471-6068-7

ISBN-10: 1-4471-6068-1

Springer · 2014