Reliability of Microtechnology: Interconnects, Devices and Systems

Interconnects

by: Johan Liu · Olli Salmela · Jussi Sarkka · James E. Morris · Per-Erik Tegehall · Cristina Andersson

Hardcover

ISBN: 978-1-4419-5759-7

ISBN-10: 1-4419-5759-6

Springer · 2011

See also:
2014PaperbackReliability of Microtechnology: Interconnects, Devices and Systems