High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing)

by R. Dean Adams

Hardcover

details (USA).
(see also: eBook (Kindle))

details (UK).
(see also: eBook (Kindle))

details (Germany).
(see also: Kindle Ausgabe)

ISBN: 978-1-4020-7255-0

ISBN-10: 1-4020-7255-4

Springer · 2002