Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices (Nato Science Series II:)

by Evgeni Gusev

Paperback

details (USA).
(see also: eBook (Kindle))

details (UK).
(see also: eBook (Kindle))

details (Germany).
(see also: Kindle Ausgabe)

details (Canada).
(see also: eBook (Kindle))

ISBN: 978-1-4020-4366-6

ISBN-10: 1-4020-4366-X

Springer · 2006