Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics: Symposium Held April 10–12, 2007, San ... U.S.A.: Volume 990 (MRS Proceedings)

Interconnects

by Qinghuang Lin

Paperback

ISBN: 978-1-107-40871-5

ISBN-10: 1-107-40871-7

Cambridge University Press · 2014