Noise and Fluctuations in Circuits, Devices, and Materials (Proceedings of Spie)

by: Massimo Macucci · Lode K. Vandamme · Carmine Ciofi · Michael B. Weissman

Paperback

details (United States).

ISBN: 978-0-8194-6737-9

ISBN-10: 0-8194-6737-5

Society of Photo Optical · 2007