Nondestructive Detection And Measurement for Homeland Security III (Proceedings of Spie)

Measurement

by: Aaron A. Diaz · A. Emin Aktan · H. Felix Wu · Steven R. Doctor · Yoseph Bar-Cohen

Paperback

ISBN: 978-0-8194-5750-9

ISBN-10: 0-8194-5750-7

Society of Photo Optical · 2005