Hot-Carrier Reliability of MOS VLSI Circuits (The Springer International Series in Engineering and Computer Science)
by:
Yusuf Leblebici
·
Sung-Mo (Steve) Kang
Hardcover
details (
United States
).
ISBN: 978-0-7923-9352-8
ISBN-10: 0-7923-9352-X
Springer
· 1993
