Neural Models and Algorithms for Digital Testing (The Springer International Series in Engineering and Computer Science)
by:
S.T. Chadradhar ·
Vishwani Agrawal
·
M. Bushnell
Hardcover
details (
USA
).
ISBN: 978-0-7923-9165-4
ISBN-10: 0-7923-9165-9
Springer
· 1991