Electron Beam Ion Sources and Traps and Their Applications: 8th International Symposium EBIS/T 2000, Upton, New York, 5-8 November 2000 (AIP Conference Proceedings)

Applications

by Krsto Prelec

Hardcover

ISBN: 978-0-7354-0011-5

ISBN-10: 0-7354-0011-3

American Institute of Physics · 2001