Modeling and Characterization of RF and Microwave Power FETs: Characterization and Modeling of LDMOS and III-V Devices (The Cambridge RF and Microwave Engineering Series)

by Jaime A. Plá , John Wood Peter Aaen Hardcover details (UK). (see also: eBook (Kindle)) details (United States). (see also: eBook (Kindle)) details (Germany). (see also: Kindle Ausgabe) details (Canada). (see also: eBook (Kindle)) ISBN: 978-0-521-87066-5 ISBN-10: 0-521-87066-6 Cambridge University Press · 2007