Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution

Resolution

by Tien T. Tsong

Hardcover

ISBN: 978-0-521-36379-2

ISBN-10: 0-521-36379-9

Cambridge University Press · 1990

See also:
2008PaperbackAtom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution