Characterization of High Tc Materials and Devices by Electron Microscopy

Microscopy

by Nigel D. Browning

Paperback

ISBN: 978-0-521-03170-7

ISBN-10: 0-521-03170-2

Cambridge University Press · 2006

See also:
2000HardcoverCharacterization of High Tc Materials and Devices by Electron Microscopy