Nanometer Technology Designs: High-Quality Delay Tests (Frontiers in Electronic Testing)
by
Nisar Ahmed
Hardcover
details (
USA
).
ISBN: 978-0-387-76486-3
ISBN-10: 0-387-76486-0
Springer
· 2007
See also:
2011
Paperback
Nanometer Technology Designs: High-Quality Delay Tests