Metal Oxide-Based Thin Film Structures: Formation, Characterization and Application of Interface-Based Phenomena (Metal Oxides)

Semiconductors

by: Nini Pryds · Vincenzo Esposito · Ghenadii Korotcenkov Ph.D. in Physics and Technology of Semiconductor Materials and Devices Dr.Sci in Physics and Mathematics of Semiconductors and Dielectrics

Paperback

ISBN: 978-0-12-811166-6

ISBN-10: 0-12-811166-6

Elsevier · 2017