Optical Characterization of Real Surfaces and Films, Volume 19: Advances in Research and Development (Physics of Thin Films)
by:
K. Vedam
·
Maurice H. Francombe
·
John L. Vossen
Hardcover
details (
USA
).
ISBN: 978-0-12-533019-0
ISBN-10: 0-12-533019-7
Academic Press
· 1994