| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| Reliability Wearout Mechanisms in Advanced CMOS Technologies | 978-0-471-73172-6 (0-471-73172-2) | 2009 | Alvin W. Strong · Ernest Y. Wu · Jordi Sune · Giuseppe La Rosa · Timothy D. Sullivan · Stewart E. Rauch III |