SPIE-International Society for Optical Engine
| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| Testing, Reliability, And Application Of Micro-And Nano-Material Systems III | 978-0-8194-5747-9 (0-8194-5747-7) | 2005 | Robert E. Geer · George Y. Baaklini · Bernd Michel |