| title | ISBN-13 | year of publica- tion | other author(s) |
|---|---|---|---|
| CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test | 978-1-4020-8362-4 | 2008 | Andrei Pavlov |
| Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits | 978-0-387-46546-3 | 2007 | José Pineda de Gyvez |
| ESD Protection Device and Circuit Design for Advanced CMOS Technologies | 978-1-4020-8300-6 | 2008 | Oleg Semenov · Hossein Sarbishaei |
| Thermal and Power Management of Integrated Circuits | 978-0-387-25762-4 | 2006 | Arman Vassighi |