D. M. Fleetwood · Daniel Fleetwood · Daniel M.
CRC · SPIE-International Society for Optical Engine · World Scientific Publishing Company
| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| Defects in Microelectronic Materials and Devices | 978-1-4200-4376-1 (1-4200-4376-5) | 2008 | Sokrates T. Pantelides · Ronald D. Schrimpf |
| Noise in Devices And Circuits 3 | 978-0-8194-5839-1 (0-8194-5839-2) | 2005 | Alexander A. Balandin · Francois Danneville · M. Jamal Deen |
| Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices | 978-981-238-940-4 (981-238-940-7) | 2004 | |