| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| Frontiers of Characterization and Metrology for Nanoelectronics: 2009 | 978-0-7354-0712-1 (0-7354-0712-6) | 2009 | Erik M. Secula · David G. Seiler · Rajinder P. Khosla · Dan Herr · Robert McDonald · Alain C. Diebold |
C. G. · C.M. · Michael Garner