A.C. · A.C. Diebold · a. D. · C.D.
| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| Characterization and Metrology for ULSI Technology 2005 | 978-0-7354-0277-5 (0-7354-0277-9) | 2005 | David G. Seiler · Robert McDonald · Caroline R. Ayre · Rajinder P. Khosla · Stefan Zollner · Erik M. Secula |
| Frontiers of Characterization and Metrology for Nanoelectronics: 2009 | 978-0-7354-0712-1 (0-7354-0712-6) | 2009 | Erik M. Secula · David G. Seiler · Rajinder P. Khosla · Dan Herr · C. Michael Garner · Robert McDonald |