Defects in Microelectronic Materials and Devices
by: Daniel M. Fleetwood · Sokrates T. Pantelides · Ronald D. Schrimpf
CRC · 17. November 2008
Hardcover
details (USA).
details (UK).
details (Canada).
details (Germany).
details (France).
ISBN: 978-1-4200-4376-1
ISBN-10: 1-4200-4376-5