| year of publication | ISBN | author(s) | title |
|---|---|---|---|
| 2001 | 978-0-9651577-6-6 | Calif.)) International Symposium on Plasma Process-Induced Damage (6th : 2001 : Monterey | International Symposium on Plasma and Process-Induced Damage: 1996-2001 Proceedings |
| 978-0-9651577-8-0 | Terence Hook · Koji Eriguchi and Calvin T. Gabriel · editors · technical co-sponsors · AVS · IEEE/Electron Devices Society · Japanese Society of Applied Physics | 2002 7th International Symposium on Plasma- and Process-induced Damage June 5-7, 2002, Maui, Hawaii, USA |