Characterization of High Tc Materials and Devices by Electron Microscopy

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2006PaperbackCharacterization of High Tc Materials and Devices by Electron Microscopy
Microscopy

by: Nigel D. Browning · Stephen J. Pennycook

Cambridge University Press · 2000

Hardcover

ISBN: 978-0-521-55490-9

ISBN-10: 0-521-55490-X