Characterization of High Tc Materials and Devices by Electron Microscopy

See also:
2000HardcoverCharacterization of High Tc Materials and Devices by Electron Microscopy
Microscopy

by: Nigel D. Browning · Stephen J. Pennycook

Cambridge University Press · 2006

Ppb.

ISBN: 978-0-521-03170-7

ISBN-10: 0-521-03170-2